Comparator

The EX1200-7416 is a 16 Channel Comparator/Event Detector with up to 96 differential channels per full rack mainframe

Request A Quote
  • Overview
  • Manuals
  • Data Sheets
  • Software
  • Drivers
  • Up to 96 differential channels per full rack mainframe
  • Constantly monitor input signals for fault conditions
  • Flexible configurations for detecting edges, out-of-bounds conditions and measuring pulse widths
  • Inputs can be masked, inverted, and combined to produce interrupts
  • Can be used as a time stamp module and as a digital I/O
  • Programmable debounce circuitry prevents erroneous readings
  • 10 V and 100 V input ranges
  • On-board memory stores events with IEEE 1588 timestamps
  • Synchronize reading of input states with other scanned analog channels
The EX1200-7416 has sixteen true differential channels of analog comparator input that can be selected to provide an interrupt to the EX1200 system when the input falls outside the software programmed bounds, independent of the scan list operation. The EX1200-7416 is an ideal device in “go/no-go” testing, where a device fails if the voltage outputs exceed a threshold or window, or in control applications where a device or test needs to be shut down if a voltage level is exceeded. Using an analog comparator/interrupter in certain applications, as opposed to a traditional scanning approach, considerably improves the overall response time of the system, providing the ability to ‘constantly monitor’ signals of interest for fault conditions.

The inputs are independently software programmable, permitting the user to vary input thresholds per channel. Each input signal is also digitally debounced for a programmed time ranging from 1 μs to 500 ms, preventing input signal noise from causing undesired interrupts. The threshold polarity can be programmed to detect either a rising or falling edge or can be masked to prevent unused channels from causing interrupts. All of the enabled inputs are OR’d together to produce a single interrupt signal. Input can be combined via math functions to create virtual channels when multiple conditions must be satisfied before an event is recorded. On board memory stores events with precise IEEE 1588 timestamps. The interrupt signal can be routed through the front panel connector for distribution to other devices in the test system for absolute deterministic communication.

There are three modes of operation that satisfy a wide range of applications. In normal mode, any channel crossing a threshold with the programmed polarity will cause an event to be latched into memory. Window mode automatically parallels two adjacent input channels and is used when an input signal is expected to be within upper and lower bounds. Pulse mode provides a means for measuring the pulse width of input signals by automatically changing the threshold polarity at each crossing.
img1
EX1200 Series Product Manual - 82-0127-000 (Rev:16/JUL)
img1
EX1200-7416 Product Manual - 82-0127-004 Rev 01-06-2021
img1
VTEX Scanner Driver Product Manual - 82-0128-000 (Rev:10/JUL)
img1
VTEX System Driver Product Manual - 82-0125-000 (Rev:10/JUL)
Title
Document
Download
EX1200 Series Product Manual - 82-0127-000 (Rev:16/JUL)
DocumentEX1200 Series Product Manual - 82-0127-000 (Rev:16/JUL)
EX1200-7416 Product Manual - 82-0127-004 Rev 01-06-2021
DocumentEX1200-7416 Product Manual - 82-0127-004 Rev 01-06-2021
VTEX Scanner Driver Product Manual - 82-0128-000 (Rev:10/JUL)
DocumentVTEX Scanner Driver Product Manual - 82-0128-000 (Rev:10/JUL)
VTEX System Driver Product Manual - 82-0125-000 (Rev:10/JUL)
DocumentVTEX System Driver Product Manual - 82-0125-000 (Rev:10/JUL)
img1
EX1200 Series Datasheet (Rev:A)
img1
EX1200-7416 Datasheet
Title
Document
Download
EX1200 Series Datasheet (Rev:A)
DocumentEX1200 Series Datasheet (Rev:A)
EX1200-7416 Datasheet
DocumentEX1200-7416 Datasheet
img1
62-0083-100--FIRMWARE EX1200 Non Switch Card Upgrade (Rev:3.13.27)
Title
Document
Download
62-0083-100--FIRMWARE EX1200 Non Switch Card Upgrade (Rev:3.13.27)
Document62-0083-100--FIRMWARE EX1200 Non Switch Card Upgrade (Rev:3.13.27)
img1
Common - Linux C++ Driver (Rev:3.12.19)
img1
Comparator - IVI DRIVER - 72-0305-000
img1
Comparator - LabVIEW Driver p/n 72-0303-000
img1
Comparator - LabView RT Driver - 72-0402-000
img1
Comparator - Linux C++ Driver p/n 72-0301-000
Title
Document
Download
Common - Linux C++ Driver (Rev:3.12.19)
DocumentCommon - Linux C++ Driver (Rev:3.12.19)
Comparator - IVI DRIVER - 72-0305-000
DocumentComparator - IVI DRIVER - 72-0305-000
Comparator - LabVIEW Driver p/n 72-0303-000
DocumentComparator - LabVIEW Driver p/n 72-0303-000
Comparator - LabView RT Driver - 72-0402-000
DocumentComparator - LabView RT Driver - 72-0402-000
Comparator - Linux C++ Driver p/n 72-0301-000
DocumentComparator - Linux C++ Driver p/n 72-0301-000

* Required entries
 Required for USA and Canada
Note:
If you experience any difficulty submitting this form, contact: webmaster@zygo.com

** You may withdraw this consent at any time using the "unsubscribe" link at the bottom of any page on this web site.
X
By continuing to use this site, you agree to our Privacy Policy.
OK